8.4
Élevée
CVE-2022-25696 Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto,…
Description
Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Produits et versions touchés
| Produit | Versions touchées | Corrigé en |
|---|---|---|
| Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables | Versions non publiées |
Références
- www.qualcomm.com www.qualcomm.com
Chronologie
- Publiée
- Dernière modification
Autres CVE de Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Les 7 CVE de Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables →
CVE-2022-25686
Memory corruption in video module due to buffer overflow while processing WAV file in Snapdragon Auto, Snapdragon…
7.3
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CVE-2022-25656
Possible integer overflow and memory corruption due to improper validation of buffer size sent to write to console…
8.4
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CVE-2022-25657
Memory corruption due to buffer overflow occurs while processing invalid MKV clip which has invalid seek header in…
7.3
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CVE-2022-22069
Devices with keyprotect off may store unencrypted keybox in RPMB and cause cryptographic issue in Snapdragon Auto,…
7.7
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