8.4
High
CVE-2022-25696 Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto,…
Description
Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Affected products and versions
| Product | Affected versions | Fixed in |
|---|---|---|
| Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables | Versions not published |
References
- www.qualcomm.com www.qualcomm.com
Timeline
- Published
- Last modified
Other CVEs of Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
The 7 CVEs of Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables →
CVE-2022-25686
Memory corruption in video module due to buffer overflow while processing WAV file in Snapdragon Auto, Snapdragon…
7.3
High
CVE-2022-25656
Possible integer overflow and memory corruption due to improper validation of buffer size sent to write to console…
8.4
High
CVE-2022-25657
Memory corruption due to buffer overflow occurs while processing invalid MKV clip which has invalid seek header in…
7.3
High
CVE-2022-22069
Devices with keyprotect off may store unencrypted keybox in RPMB and cause cryptographic issue in Snapdragon Auto,…
7.7
High