7.8
High
CVE-2025-47317 Memory corruption due to global buffer overflow when a test command uses an invalid payload type
Description
Memory corruption due to global buffer overflow when a test command uses an invalid payload type.
Affected products and versions
| Product | Affected versions | Fixed in |
|---|---|---|
| Snapdragon | Versions not published |
References
- docs.qualcomm.com docs.qualcomm.com
Timeline
- Published
- Last modified
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