CVE-2023-28587 Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level

Description

Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level.

Affected products and versions

Product	Affected versions	Fixed in
Snapdragon	Versions not published

Other CVEs of Snapdragon

The 997 CVEs of Snapdragon →

CVE-2026-57559 Memory corruption while processing service requests 7.8 High CVE-2026-57555 Memory Corruption when executing system service routines due to improper handling of user input buffers 7.8 High CVE-2026-57554 Memory Corruption when asynchronous threads access shared performance counter data simultaneously during FastRPC… 7.8 High CVE-2026-57546 Transient DOS when processing a continuous receive command with a zero-sized global configuration override 7.5 High