Not rated
CVE-2018-13888 There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array…
Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Affected products and versions
| Product | Affected versions | Fixed in |
|---|---|---|
| Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables | Versions not published |
References
- 106475 www.securityfocus.com
- www.qualcomm.com www.qualcomm.com
Timeline
- Published
- Last modified
Other CVEs of Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
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CVE-2018-13914
Lack of input validation for data received from user space can lead to an out of bound array issue in Snapdragon Auto,…
Not rated