7.8
High
CVE-2025-47380 Memory corruption while preprocessing IOCTLs in sensors
Description
Memory corruption while preprocessing IOCTLs in sensors.
Affected products and versions
| Product | Affected versions | Fixed in |
|---|---|---|
| Snapdragon | Versions not published |
References
- docs.qualcomm.com docs.qualcomm.com
Timeline
- Published
- Last modified
Other CVEs of Snapdragon
The 997 CVEs of Snapdragon →
CVE-2026-57559
Memory corruption while processing service requests
7.8
High
CVE-2026-57555
Memory Corruption when executing system service routines due to improper handling of user input buffers
7.8
High
CVE-2026-57554
Memory Corruption when asynchronous threads access shared performance counter data simultaneously during FastRPC…
7.8
High
CVE-2026-57546
Transient DOS when processing a continuous receive command with a zero-sized global configuration override
7.5
High