CVE-2024-45573 Memory corruption may occour while generating test pattern due to negative indexing of display ID

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Affected products and versions

Product	Affected versions	Fixed in
Snapdragon	Versions not published

Other CVEs of Snapdragon

The 997 CVEs of Snapdragon →

CVE-2026-57559 Memory corruption while processing service requests 7.8 High CVE-2026-57555 Memory Corruption when executing system service routines due to improper handling of user input buffers 7.8 High CVE-2026-57554 Memory Corruption when asynchronous threads access shared performance counter data simultaneously during FastRPC… 7.8 High CVE-2026-57546 Transient DOS when processing a continuous receive command with a zero-sized global configuration override 7.5 High